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    1. X-ray diffraction analysis

      基本解釋X射線衍射分析

      網絡釋義

      1)X-ray diffraction analysis,X射線衍射分析2)XRD,X射線衍射分析3)X-ray diffraction,X射線衍射分析4)X ray diffraction analysis,X射線衍射分析5)X ray diffraction,X射線衍射分析6)XRD,X-射線衍射分析

      用法和例句

      Change of macroscopic stress in ZnSe devices during the processing was determined by X-ray diffraction analysis.

      X射線衍射分析技術測定晶體器件在加工過程中宏觀應力的變化。

      Talc powder in flour was determined by X-ray diffraction analysis(XRD) after isolation of flour with carbon tetrachloride or cineration at high temperature from 500℃ to 750℃.

      通過四氯化碳分離或高溫灰化,X射線衍射分析測定面粉中摻入的滑石粉。

      X-ray diffraction analysis and differenti al thermal analysis(DTA)have been used to study the structure of Pd-20W alloy.

      對Pd - 2 0W合金進行X射線衍射分析和差熱分析 ,結果表明 :Pd - 2 0W合金是面心立方固溶體 ,合金的晶格點陣參數和晶粒大小隨著溫度的變化而變化 ,在溫度緩慢下降至 75 0℃時出現了超結構轉變。

      The XRD analysis of sample shown that the crystal-grain dimension, the diffraction peak intensity and the crystal lattice constant were affected by annealing time.

      對以銦、錫氯化物為前驅物,采用溶膠-凝膠法制備的摻錫氧化銦薄膜(ITO膜)樣品進行了X射線衍射分析,研究了熱處理時間對ITO膜的影響,結果表明熱處理時間影響ITO膜晶粒的大小、衍射峰的相對強度和晶格常數;熱處理時間為15min時,ITO膜晶粒較大,衍射峰擇優取向不明顯,晶格畸變較小,此時ITO膜的方阻最小。

      The XRD analysis of sample showed that the diffraction peak intensity,the crystal lattice constant and crystal-grain dimension were affected by annealing temperature.

      采用溶膠-凝膠法以銦、錫氯化物為前驅物制備不同熱處理溫度下的ITO膜,對制備的ITO膜樣品進行X射線衍射分析。

      X-ray diffraction (XRD) program was improved.

      同時,簡要介紹運用X射線衍射分析判斷新相生成并對其進行表征,探討制備條件對組成結構的影響,推測反應機理及解決生產中的問題,為制備合格材料提供依據。

      Multi-anvil apparatus and X-ray diffraction technology were used to investigate the phase transformation of synthesized NaAlSiO_(4) over a temperature range from 1200 to 2000 ℃ and a pressure range from 22 to 25 GPa.

      采用多頂砧靜態高溫高壓實驗裝置和X射線衍射分析方法研究了合成霞石NaAlSiO4在壓力為22~25GPa,溫度為1200~2000℃條件下的相變及其產物的晶體學特征,結合前人研究成果探討了NaAlSiO4的高溫高壓相變過程和CaFe2O4型NaAlSiO4的穩定性及其地質意義。

      X-ray diffraction,including Bragg\'s equation in crystallography,the Fourier transform of helical structures,and Wilkins\' experimental determination of the double helix are discussed.

      簡述了薛定諤對基因物質的預言和德爾布呂克等人關于DNA是遺傳物質的確定;介紹了DNA結構的X射線衍射分析,其中包括在X射線晶體學中的布拉格方程,螺旋結構的傅里葉變換,威爾金斯對雙螺旋結構的實驗驗證;介紹了分子模型方法,其中包括鍵角與鍵長,雜化軌道理論,碳四面體型軌道的量子力學計算,在分子的空間構型中氫鍵的作用。

      With X ray diffraction analysis, phases of complicated aluminum electrolytes with additives which included CaF 2, MgF 2 and LiF et al were studied, and the effect of cooling rate on the formation of phase was also investigated.

      利用X射線衍射分析法研究了復雜鋁電解質的物相組成 ,同時研究了冷卻條件對電解質物相的影響·結果表明氟化鈣、氟化鋰、氟化鎂等添加劑在酸性電解質中的物相要比在堿性電解質中的復雜 ;氧化鋁的存在形式與氧化鋁的濃度有關 ;氟化鈣的物相在不同冷卻條件下具有不同的形式·這些結果的獲得對工業鋁電解質分子比的分析具有重要意

      This paper introduces X Ray Diffraction Analysis, the most widely used method in identifying soil minerals, including the principles, testing procedures, diffractometer, sample preparation and the diagram for mineral identification.

      介紹了鑒定土中的礦物成分最常用的 X射線衍射分析方法 ,包括分析原理、試驗程序、儀器設備、試樣制備和結果整理 。

      Through X ray diffraction(XRD) analysis of high rank Carboniferous period coal located in the northern foreland basin of Dabie Orogenic Belt in the eastern China,the evolution character of XRD parameters of high rank coals and the effecting factors are studied.

      通過對大別造山帶前陸盆地石炭紀含煤巖系高煤級煤的X射線衍射分析 ,探討了高煤級煤基本結構單元的演化特征及其影響因素。

      The nucleation and crystallization of Li2O-Al2O3-SiO2 glasses which has P2O5、TiO2、ZnF2 as nuclear doses independently are investigated by the differential thermal analysis(DTA),X-ray diffraction(XRD) and the scanning electron microscopy(SEM).

      采用差熱分析(DTA)、X-射線衍射分析(XRD)和掃描電鏡(SEM)等分析手段研究了P2O5、TiO2、ZnF2作為晶核劑對Li2O-Al2O3-SiO2(LAS)系統微晶玻璃形核和晶化的影響。

      Based on the analysis of the chemical composition,X-ray diffraction(XRD),infrared spectroscopy(IR),differential thermal analysis(DTA) and scanning electron microscopy(SEM),the characteristics of Handan bentonite were studied.

      采用化學成分分析、X-射線衍射分析、紅外光譜、差熱分析和掃描電鏡等分析方法,研究了邯鄲膨潤土的特征。

      The Analysis of Nanostructured Co/Fe/Cu Granular Alloys by X-ray Diffraction;

      納米Co/Fe/Cu合金的X射線衍射分析

      Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray Diffraction

      J75不銹鋼淬火應力的X射線衍射分析

      X-ray diffraction analysis of Pt film prepared by magnetron sputtering method

      磁控濺射Pt薄膜織構的X射線衍射分析

      Expression, Crystallization, and X-ray Diffraction Analysis of Polyhydroxyalkanoate Granule Associated Proteins;

      PHA顆粒結合蛋白的表達、結晶與X射線衍射分析

      Study on Molten Structure of Ni_3Al Alloy by High Temperature X-ray Diffraction

      Ni_3Al合金熔體結構的高溫X射線衍射分析

      Application of XRD Technique in Aluminum Electrolysis Industry

      X射線衍射分析技術在電解鋁工業中的應用

      X-ray Diffractive analysis of Crystal Structure ?

      X-射線衍射晶體分析

      Application of X-ray Diffraction Technology in Material Analysis

      X射線衍射技術在材料分析中的應用

      The microstructure of the film was characterized by X ray diffraction, transmission electron microscopy, and selected area diffraction.

      用X射線衍射儀、射電鏡及其選區衍射來分析薄膜的微結構。

      Combined Analysis of Urinary Stones by X-ray Photoelectron Spectroscopy and X-ray Powder Diffraction

      泌尿系結石的X射線光電子能譜和X射線衍射聯合分析

      Study on the identification of standard and false Ejiao by XRF and PXRD

      真偽阿膠的X射線熒光分析及X射線衍射鑒別研究

      x ray photoemission diffraction

      x射線光電發射衍射

      " Metal materials--Quantitative phase analysis--""Value K""method of X-ray diffraction"

      GB/T5225-1985金屬材料定量相分析X射線衍射K值法

      Analysis on Crystalline Structure of Cellulose Fiber from Cotton-Straw Bast by X-ray Diffraction Method

      X射線衍射法分析棉稈皮纖維結晶結構

      Analysis of Tritium-Aging Effects of LaNi_5 Alloys Using XRD

      利用X射線衍射技術分析LaNi_5氚老化效應

      single crystal X-ray diffractometer

      單晶體x射線衍射儀

      nondiffraction X-ray spectrometer

      非衍射x射線光譜儀

      X-ray diffraction pattern computer

      X射線衍射圖譜計算機

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